MBT鋰離子(zi)電(dian)(dian)(dian)池(chi)生產線質(zhi)(zhi)量檢測(ce)儀的(de)產品概述MBT-x 是用于電(dian)(dian)(dian)池(chi)生產和(he)(he)質(zhi)(zhi)量保證的(de)測(ce)量模塊: MBT-x可(ke)以(yi)對電(dian)(dian)(dian)池(chi)單元和(he)(he)電(dian)(dian)(dian)池(chi)組(zu)進性快速測(ce)試,還可(ke)以(yi)在電(dian)(dian)(dian)池(chi)下線EoL中檢查焊接(jie)接(jie)頭的(de)質(zhi)(zhi)量; MBT-x在0.4秒內(nei)測(ce)量3個關鍵電(dian)(dian)(dian)池(chi)參數(shu)(交流(liu)內(nei)阻、直(zhi)流(liu)內(nei)阻和(he)(he)電(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)壓); 附加(jia)模式允許自動溫度補償(chang);
800V 鋰(li)電(dian)(dian)(dian)(dian)池(chi)系統(tong)(tong)阻抗和(he)電(dian)(dian)(dian)(dian)壓(ya) 測(ce)(ce)試(shi)儀BIM-HV BIM-HV 是測(ce)(ce)量(liang)高達 800V 鋰(li)電(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)池(chi)系統(tong)(tong)阻抗和(he)電(dian)(dian)(dian)(dian)壓(ya)的(de)(de)儀器: BIM-HV 結合了電(dian)(dian)(dian)(dian)池(chi)測(ce)(ce)試(shi)儀和(he)電(dian)(dian)(dian)(dian)池(chi)分析儀的(de)(de)功能,可以獨立于技術對電(dian)(dian)(dian)(dian)池(chi)進行(xing)快速測(ce)(ce)試(shi); BIM-HV 測(ce)(ce)量(liang) 1Hz 和(he) 1kHz 之間的(de)(de)EIS,加上電(dian)(dian)(dian)(dian)池(chi)、模(mo)組和(he)系統(tong)(tong)的(de)(de)電(dian)(dian)(dian)(dian)壓(ya), 以確(que)定電(dian)(dian)(dian)(dian)池(chi)的(de)(de)狀態(SoH、SoC)和(he)工(gong)作參數,并且(qie)無需復雜(za)的(de)(de)放(fang)電(dian)(dian)(dian)(dian)方法即可進行(xing)容量(liang)測(ce)(ce)量(liang)
便攜式BIM鋰離(li)子電(dian)池組(zu)交流阻抗測(ce)試儀(yi)的(de)產(chan)品概述 BTC1 是一款(kuan)通(tong)用電(dian)池測(ce)試儀(yi) ,可以(yi)測(ce)試10Ah以(yi)下的(de)單電(dian)池: BTC1 可以(yi)測(ce)量電(dian)壓、交流阻抗譜和 BTC1 可以(yi)通(tong)過外部傳感器(qi)測(ce)量溫度;
便攜式BTC鋰離子單(dan)電(dian)(dian)池交流阻抗測試(shi)儀的(de)產品概述(shu) BTC1 是一款通用電(dian)(dian)池測試(shi)儀 ,可(ke)以(yi)(yi)測試(shi)10Ah以(yi)(yi)下的(de)單(dan)電(dian)(dian)池: BTC1 可(ke)以(yi)(yi)測量電(dian)(dian)壓、交流阻抗譜和 BTC1 可(ke)以(yi)(yi)通過外部傳感器(qi)測量溫度;
電化學(xue)原子(zi)(zi)(zi)力顯(xian)微(wei)(wei)鏡EC-AFM-掃(sao)描的產品概(gai)述 多功能原子(zi)(zi)(zi)力顯(xian)微(wei)(wei)鏡平臺,滿足納(na)米(mi)級(ji)測量(liang)的需求 原子(zi)(zi)(zi)力顯(xian)微(wei)(wei)鏡(AFM)有納(na)米(mi)級(ji)分(fen)辨率(lv)成像以及電,磁,熱和(he)(he)機(ji)器性能測量(liang)的能力。 納(na)米(mi)管掃(sao)描系統可用于高分(fen)辨率(lv)掃(sao)描離子(zi)(zi)(zi)電導顯(xian)微(wei)(wei)鏡(SICM). 倒置光學(xue)顯(xian)微(wei)(wei)鏡(IOM)便(bian)于透明材料(liao)研(yan)究和(he)(he)熒光顯(xian)微(wei)(wei)鏡一(yi)體化。
高阻(zu)(zu)抗(kang)(T歐級)涂層(ceng)測(ce)試儀(yi)- 腐蝕電化學的(de)(de)產品(pin)概述 PGU IMP Micro是為德國弗勞恩(en)霍夫陶(tao)瓷技術和(he)系統研(yan)究所(Fraunhofer-Institut für Keramische Technologien und Systeme,IKTS)特殊(shu)設計(ji)的(de)(de)。在IPS愛譜(pu)斯(si)標準阻(zu)(zu)抗(kang)恒電位儀(yi)PGU 10V-1A-IMP-S的(de)(de)基礎上升級成一個可靠測(ce)量高阻(zu)(zu)抗(kang)的(de)(de)恒電位儀(yi)PGU IMP Micro。